Cyclopentadienylallylnickel CpNi(allyl) has been used for CVD growth of Ni metal, with H2 carrier gas. High deposition
rate (13 nm/min) with low residual carbon (4% C) at low deposition temperature at (120 °C) has been achieved; low growth temperature was possible due to interactions of CpAllylNi and H2. CpAllylNi is superior to (MeCp)2Ni with respect to volatility and leaving residual carbon in the deposited film.
Therefore, it is one of the best precursors for depositing Ni thin films with low carbon impurity by low-pressure CVD.[i]
[i] T. Kada, M.Ishikawa, H.Machida, A.Ogura, Y.Ohshita, K.Soai, J. Cryst. Growth,2005, Vol.275,Iss.1-2, e1115-e1119, doi.org/10.1016/j.jcrysgro.2004.11.198, www.sciencedirect.com/science/article/pii/S0022024804016434